DocumentCode
1395298
Title
A Surface-Potential-Based Compact Model for AlGaN/GaN MODFETs
Author
Cheng, Xiaoxu ; Wang, Yan
Author_Institution
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Volume
58
Issue
2
fYear
2011
Firstpage
448
Lastpage
454
Abstract
In this paper, a surface-potential-based (SP-based) model for AlGaN/GaN modulation-doped field-effect transistors (MODFETs) is built for the first time. First, a closed-form analytical approximation for the Fermi potential EF relative to the bottom of the conduction band at the AlGaN/GaN interface is presented and verified to be accurate enough under different biases and temperatures. Then, the potential of the bottom of the conduction band at the AlGaN/GaN interface φs is defined as the SP, and the value of φs relative to ground is calculated. The development of SP-based compact dc model is achieved based on this calculation. Velocity saturation, channel length modulation, drain-induced barrier lower effect, and self-heating effect are included in the presented model. Compared with the Vth-based model developed by our group, this SP-based model provides a symmetric and more accurate but simpler description for AlGaN/GaN MODFETs. The calculated dc characteristics and transconductance for devices with different lengths are in excellent agreement with the experimental data over the full range of applied gate and drain biases and under different temperatures.
Keywords
Fermi level; III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; surface potential; wide band gap semiconductors; AlGaN-GaN; Fermi potential; MODFET; channel length modulation; compact dc model; drain-induced barrier lower effect; modulation doped field effect transistors; self heating; surface potential; transconductance; velocity saturation; Aluminum gallium nitride; Approximation methods; Gallium nitride; HEMTs; Logic gates; MODFETs; Mathematical model; AlGaN/GaN modulation-doped field-effect transistors (MODFETs); compact model; surface potential (SP);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2089690
Filename
5658130
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