Reliability sampling plans for lognormal distribution, based on progressively-censored samples

Author

Balasooriya, Uditha ; Balakrishnan, N.

Author_Institution

Dept. of Stat. & Appl. Probability, Nat. Univ. of Singapore, Singapore

Volume

49

Issue

2

fYear

2000

fDate

6/1/2000 12:00:00 AM

Firstpage

199

Lastpage

203

Abstract

This paper presents reliability sampling plans for the lognormal distribution based on progressively censored samples. In constructing these sampling plans, large-sample approximations to the best linear unbiased estimators of the location and scale parameters are used. For some selected progressive censoring schemes, reliability sampling plans are tabulated for p_α and p_β to match MIL-STD-105. While in general, variable-sampling plans require smaller sample size when compared with attribute-sampling plans, the ordinary complete and right-censored life test experiments are special cases of the progressively censored experiment. Hence, the progressively censored reliability sampling plans in this paper are widely applicable. General application of the procedure is discussed, and two examples are provided

Keywords

life testing; log normal distribution; reliability; sampling methods; α-normal distribution; MIL-STD-105; acceptance sampling; approximate moment of order statistic; best linear unbiased estimation; best linear unbiased estimators; large-sample approximations; lognormal distribution; progressively-censored samples; reliability sampling plans; right-censored life test experiments; selected progressive censoring schemes; type II progressive censoring; variable-sampling plans; Councils; Life estimation; Life testing; Maximum likelihood estimation; Parameter estimation; Personal communication networks; Probability; Sampling methods; Statistical distributions; Statistics;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.877338

Filename

877338