• DocumentCode
    1396162
  • Title

    Shape recovery from equal thickness contours

  • Author

    Cong, Ge ; Parvin, Bahram

  • Author_Institution
    Comput. Sci., Lawrence Berkeley Lab., CA, USA
  • Volume
    22
  • Issue
    9
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    1055
  • Lastpage
    1061
  • Abstract
    A unique imaging modality based on equal thickness contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. These ETC can be generated through an interference between transmitted and diffracted beams. We present a computational framework for representing each view of an object in terms of its object thickness and then integrating these representations into a 3D surface by algebraic reconstruction. In this framework, the object thickness is first derived from ideal contours and then extended to real data. For real data, the object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features as well as neighborhood continuity. We apply our approach to images of a submicron crystal structure obtained through a holographic process
  • Keywords
    algebra; image reconstruction; light interference; 3D shape reconstruction; 3D surface; ETC; algebraic reconstruction; beam interference; curve segment grouping; diffracted beams; equal thickness contours; holographic process; imaging modality; multiple views; neighborhood continuity; object thickness; second derivative maxima; shape recovery; shape-from-equal-thickness-contours recovery; submicron crystal structure images; transmitted beams; Computational efficiency; Computer vision; Convolution; Fast Fourier transforms; Frequency; Image reconstruction; Machine intelligence; Nonlinear filters; Pattern analysis; Shape;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.877527
  • Filename
    877527