DocumentCode
1396162
Title
Shape recovery from equal thickness contours
Author
Cong, Ge ; Parvin, Bahram
Author_Institution
Comput. Sci., Lawrence Berkeley Lab., CA, USA
Volume
22
Issue
9
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
1055
Lastpage
1061
Abstract
A unique imaging modality based on equal thickness contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. These ETC can be generated through an interference between transmitted and diffracted beams. We present a computational framework for representing each view of an object in terms of its object thickness and then integrating these representations into a 3D surface by algebraic reconstruction. In this framework, the object thickness is first derived from ideal contours and then extended to real data. For real data, the object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features as well as neighborhood continuity. We apply our approach to images of a submicron crystal structure obtained through a holographic process
Keywords
algebra; image reconstruction; light interference; 3D shape reconstruction; 3D surface; ETC; algebraic reconstruction; beam interference; curve segment grouping; diffracted beams; equal thickness contours; holographic process; imaging modality; multiple views; neighborhood continuity; object thickness; second derivative maxima; shape recovery; shape-from-equal-thickness-contours recovery; submicron crystal structure images; transmitted beams; Computational efficiency; Computer vision; Convolution; Fast Fourier transforms; Frequency; Image reconstruction; Machine intelligence; Nonlinear filters; Pattern analysis; Shape;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/34.877527
Filename
877527
Link To Document