DocumentCode :
1396380
Title :
Optimization Solvers in Run-to-Run Control
Author :
Hanish, Courtney K.
Author_Institution :
Rudolph Technol. Inc., Richardson, TX, USA
Volume :
23
Issue :
2
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
178
Lastpage :
184
Abstract :
Semiconductor manufacturing processes with multiple settings or multiple targets, such as furnace applications or processes controlling uniformity, may not have a single algebraic solution, in which case optimization methods are required. While there are many optimization algorithms available, most are not guaranteed to find the global optimum, take longer than an analytic solution, and produce a less precise result. Despite this, in practice people use optimizers even when they are not needed. This paper explains when optimizers are needed and examines how the structure of the process model can be used to speed up the optimization process and ensure that the global optimum is found.
Keywords :
optimisation; semiconductor technology; furnace applications; global optimum; optimization algorithms; optimization solvers; process model; processes controlling uniformity; run-to-run control; semiconductor manufacturing processes; Model solvers; optimization; run-to-run control; semiconductor manufacturing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2010.2041264
Filename :
5398981
Link To Document :
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