• DocumentCode
    1397147
  • Title

    A Fast ULV Logic Synthesis Flow in Many- V_{t} CMOS Processes for Minimum Energy Under Timing Constraints

  • Author

    Bol, David ; Hocquet, Cedric ; Regazzoni, Francesco

  • Author_Institution
    ICTEAM Inst., Univ. catholique de Louvain, Louvain-la-Neuve, Belgium
  • Volume
    59
  • Issue
    12
  • fYear
    2012
  • Firstpage
    947
  • Lastpage
    951
  • Abstract
    Ultra-low-voltage (ULV) logic offers the opportunity to operate at the minimum-energy point (MEP) for applications with low-to-medium speed requirements. Unfortunately, the critical design constraint of achieving a reliable timing closure at the target frequency of the application becomes very complex in the wide design space of ULV including supply (Vdd) and threshold (Vt) voltage selection as well as netlist optimizations from the synthesis. In this paper, we propose a fast synthesis flow to accurately predict the Vdd/Vt MEP under strict timing constraints. Compared to an exhaustive search for the MEP under timing constraints based on numerous library recharacterizations and synthesis steps for all Vdd/Vt pairs, the proposed ULV flow dramatically speeds up the design process. Indeed, it requires a single library recharacterization and only three synthesis steps. Results obtained for several ITC´99 benchmarks under a wide range of timing constraints from 0.1 to 30 MHz in 65-nm LP/GP CMOS demonstrate that the proposed flow has a less than 10% energy penalty with respect to the absolute MEP computed with an exhaustive search and energy savings enhanced up to 2.4× compared to a conventional flow with Vdd scaling only.
  • Keywords
    CMOS logic circuits; circuit optimisation; logic design; ITC´99 benchmarks; MEP; MEP under timing constraints; critical design constraint; energy savings; fast ULV logic synthesis flow; frequency 0.1 MHz to 30 MHz; many-voltage CMOS process; minimum energy under timing constraints; minimum-energy point; netlist optimizations; single library recharacterization; size 65 nm; threshold voltage selection; ultralow-voltage logic; Data models; Delays; Design automation; Digital integrated circuits; Integrated circuit modeling; Low power electronics; Low voltage; Optimization; Voltage control; Design automation; digital integrated circuits; timing closure; ultra-low power; ultra-low voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2012.2231034
  • Filename
    6409429