DocumentCode
1397375
Title
Influence of Channel Layer Thickness on the Electrical Performances of Inkjet-Printed In-Ga-Zn Oxide Thin-Film Transistors
Author
Wang, Ye ; Sun, Xiao Wei ; Goh, Gregory Kia Liang ; Demir, Hilmi Volkan ; Yu, Hong Yu
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume
58
Issue
2
fYear
2011
Firstpage
480
Lastpage
485
Abstract
Inkjet-printed In-Ga-Zn oxide (IGZO) thin-film transistors (TFTs) with bottom-gate bottom-contact device architecture are studied in this paper. The impact of the IGZO film thickness on the performance of TFTs is investigated. The threshold voltage, field-effect mobility, on and off drain current, and subthreshold swing are strongly affected by the thickness of the IGZO film. With the increase in film thickness, the threshold voltage shifted from positive to negative, which is related to the depletion layer formed by the oxygen absorbed on the surface. The field-effect mobility is affected by the film surface roughness, which is thickness dependent. Our results show that there is an optimum IGZO thickness, which ensures the best TFT electrical performance. The best result is from a 55-nm-thick IGZO TFT, which showed a field-effect mobility in the saturation region of 1.41 cm2/V·s, a threshold voltage of 1 V, a drain current on/off ratio of approximately 4.3 × 107, a subthreshold swing of 384 mV/dec, and an off-current level lower than 1 pA.
Keywords
field effect transistors; gallium compounds; indium compounds; ink jet printing; thin film transistors; In-Ga-Zn; bottom-gate bottom-contact device architecture; channel layer thickness; electrical performances; field-effect mobility; film surface roughness; inkjet-printed thin-film transistor; off drain current; on drain current; size 55 nm; subthreshold swing; threshold voltage; voltage 1 V; Ink; Logic gates; Performance evaluation; Printing; Thin film transistors; Threshold voltage; Film thickness; In-Ga-Zn oxide (IGZO); inkjet printing; thin-film transistors (TFTs);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2091131
Filename
5659899
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