• DocumentCode
    139741
  • Title

    Occlusal caries detection using random walker algorithm: A graph approach

  • Author

    Bampis, Christos G. ; Koutsouri, Georgia D. ; Berdouses, Elias ; Tripoliti, Evanthia E. ; Iliopoulou, Dimitra ; Koutsouris, Dimitris ; Oulis, Constantine ; Fotiadis, Dimitrios I.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    1929
  • Lastpage
    1932
  • Abstract
    The aim of this work is to present a modification of the Random Walker algorithm for the segmentation of occlusal caries from photographic color images. The modification improves the detection and time execution performance of the classical Random Walker algorithm and also deals with the limitations and difficulties that the specific type of images impose to the algorithm. The proposed modification consists of eight steps: 1) definition of the seed points, 2) conversion of the image to gray scale, 3) application of watershed transformation, 4) computation of the centroid of each region, 5) construction of the graph, 6) application of the Random Walker algorithm, 7) smoothing and extraction of the perimeter of the regions of interest and 8) overlay of the results. The algorithm was evaluated using a set of 96 images where 339 areas of interest were manually segmented by an expert. The obtained segmentation accuracy is 93%.
  • Keywords
    biomedical optical imaging; dentistry; image colour analysis; image segmentation; medical image processing; Random Walker algorithm; centroid computation; classical random walker algorithm; graph approach; graph, construction; gray scale; occlusal caries detection; occlusal caries segmentation; photographic color imaging; regions of interest; time execution performance; watershed transformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6943989
  • Filename
    6943989