• DocumentCode
    1397449
  • Title

    Carrier diffusion effect in tapered semiconductor-laser amplifier

  • Author

    Lai, Jie-Wei ; Lin, Ching-Fuh

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    34
  • Issue
    7
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    1247
  • Lastpage
    1256
  • Abstract
    This paper proposes a theoretical model to study the beam amplification and the influence of the lateral drift and diffusion on the tapered semiconductor-laser amplifier in great detail. The overall effect of the lateral drift and diffusion could be represented by an effective diffusion coefficient. The analysis, which treats the effective diffusion coefficient as a controllable parameter, shows that both the beam quality and optoelectrical property can be improved using a large effective diffusion coefficient. The analysis also indicates that the effective diffusion in the separate-confinement heterostructure layer could affect the beam quality in the quantum-well amplifiers. In addition, the thermal effect on the device performance is studied and its influence is found to be extremely significant for the high-diffusion cases
  • Keywords
    carrier mobility; diffusion; laser beams; laser theory; quantum well lasers; semiconductor device models; semiconductor lasers; beam amplification; beam quality; carrier diffusion effect; controllable parameter; device performance; effective diffusion coefficient; high-diffusion cases; large effective diffusion coefficient; lateral diffusion; lateral drift; optoelectrical property; quantum-well amplifiers; separate-confinement heterostructure layer; tapered semiconductor-laser amplifier; thermal effect; Fluctuations; High power amplifiers; Laser beams; Optical beams; Optical distortion; Power amplifiers; Power generation; Pulse amplifiers; Semiconductor lasers; Semiconductor optical amplifiers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.687869
  • Filename
    687869