VBIC95, the vertical bipolar inter-company model

Author

McAndrew, Colin C. ; Seitchik, Jerold A. ; Bowers, Derek F. ; Dunn, Mark ; Foisy, Mark ; Getreu, Ian ; McSwain, Marc ; Moinian, Shahriar ; Parker, James ; Roulston, David J. ; Schröter, Michael ; Van Wijnen, Paul ; Wagner, Lawrence F.

Author_Institution

Motorola Inc., Tempe, AZ, USA

Volume

31

Issue

10

fYear

1996

fDate

10/1/1996 12:00:00 AM

Firstpage

1476

Lastpage

1483

Abstract

This paper details the VBIC95 bipolar junction transistor (BJT) model. The model was developed as an industry standard replacement for the SPICE Gummel-Poon (SGP) model, to improve deficiencies of the SGP model that have become apparent over time because of the advances in BJT process technology. VBIC95 is still based on the Gummel-Poon formulation, and thus can degenerate to be similar to the familiar SGP model. However, it includes improved modeling of the Early effect, quasi-saturation, substrate and oxide parasitics, avalanche multiplication, and temperature behavior that can be invoked selectively based on model parameter values

Keywords

bipolar transistors; semiconductor device models; Early effect; SPICE Gummel-Poon model; VBIC95; avalanche multiplication; inter-company model; oxide parasitics; quasi-saturation; substrate parasitics; temperature behavior; vertical bipolar junction transistor; Capacitance; Identity-based encryption; Knee; Linear approximation; Noise measurement; Voltage;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.540058

Filename

540058