Title :
Thin film write head field analysis using a benchmark problem
Author :
Fujiwara, Koji ; Ikeda, Fumiaki ; Kameari, Akihisa ; Kanai, Yasushi ; Nakamura, Kimio ; Takahashi, Norio ; Tani, Koji ; Yamada, Takashi
Author_Institution :
Dept. of Electr. & Electron. Eng., Okayama Univ., Japan
fDate :
7/1/2000 12:00:00 AM
Abstract :
A benchmark problem has been proposed by the Storage Research Consortium (SRC) in Japan, for evaluating the applicability of computer codes to 3-D nonlinear eddy current analysis of thin film magnetic recording write head. Various codes using the finite element method are compared in terms of the write head field and the computational efficiency. The difficulty in 3-D mesh generation of thin film head is also discussed. The write head fields calculated by various codes using different meshes show fairly good agreement. The calculated write head fields are verified by measurement using a stroboscopic electron beam tomography. It is found that the calculation time strongly depends on unknown variables
Keywords :
eddy currents; magnetic heads; magnetic recording; magnetic thin film devices; mesh generation; tomography; 3-D mesh generation; 3-D nonlinear eddy current analysis; Japan; Storage Research Consortium; benchmark problem; computational efficiency; computer codes; finite element method; stroboscopic electron beam tomography; thin film magnetic recording write head; thin film write head field analysis; Computational efficiency; Eddy currents; Finite element methods; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic recording; Mesh generation; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
