DocumentCode
1398084
Title
The application of surface-measurement techniques to transistors
Author
Beale, J.R.A. ; Thomas, D.E. ; Watkins, T.B.
Volume
106
Issue
17
fYear
1959
fDate
5/1/1959 12:00:00 AM
Firstpage
1004
Lastpage
1008
Abstract
In a previous paper the authors have described the principle of a method for studying the recombination surface of a transistor. This paper discusses the physical concepts on which the method is based, and outlines how it may be applied, in conjunction with other techniques, to the systematic study of the effects of any surface treatment. Some practical details of the apparatus and techniques are described and the value of the method is illustrated by an example.
Keywords
characteristics measurement; transistors;
fLanguage
English
Journal_Title
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher
iet
ISSN
0369-8890
Type
jour
DOI
10.1049/pi-b-2.1959.0184
Filename
5244144
Link To Document