DocumentCode :
1398378
Title :
Designing electronic devices to survive power-quality events
Author :
McEachern, Alex
Author_Institution :
Power Stand. Lab., Emeryville, CA, USA
Volume :
6
Issue :
6
fYear :
2000
Firstpage :
66
Lastpage :
69
Abstract :
The most common electric power-quality events-sags, swells, and transients-have been identified and quantified in national studies by US utilities and the Electric Power Research Institute (EPRI). Utilities are making efforts to improve power quality; however, it also makes sense to design loads, such as appliances, process control computers, and semiconductor manufacturing systems, to tolerate common power-quality events. This article suggests some design criteria for "power-quality-tolerant" designs, and suggests ways of achieving them. Warranty and service costs will be reduced and customer satisfaction increased
Keywords :
electronic equipment manufacture; power supply quality; power system transients; process control; EPRI; Electric Power Research Institute; US utilities; electronic devices; power-quality events; process control computers; sags; semiconductor manufacturing systems; service costs; swells; transients; warranty costs; Costs; Customer satisfaction; Environmental economics; Home appliances; Microwave ovens; Power generation economics; Power quality; Process control; Voltage fluctuations; Warranties;
fLanguage :
English
Journal_Title :
Industry Applications Magazine, IEEE
Publisher :
ieee
ISSN :
1077-2618
Type :
jour
DOI :
10.1109/2943.877842
Filename :
877842
Link To Document :
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