DocumentCode
1398378
Title
Designing electronic devices to survive power-quality events
Author
McEachern, Alex
Author_Institution
Power Stand. Lab., Emeryville, CA, USA
Volume
6
Issue
6
fYear
2000
Firstpage
66
Lastpage
69
Abstract
The most common electric power-quality events-sags, swells, and transients-have been identified and quantified in national studies by US utilities and the Electric Power Research Institute (EPRI). Utilities are making efforts to improve power quality; however, it also makes sense to design loads, such as appliances, process control computers, and semiconductor manufacturing systems, to tolerate common power-quality events. This article suggests some design criteria for "power-quality-tolerant" designs, and suggests ways of achieving them. Warranty and service costs will be reduced and customer satisfaction increased
Keywords
electronic equipment manufacture; power supply quality; power system transients; process control; EPRI; Electric Power Research Institute; US utilities; electronic devices; power-quality events; process control computers; sags; semiconductor manufacturing systems; service costs; swells; transients; warranty costs; Costs; Customer satisfaction; Environmental economics; Home appliances; Microwave ovens; Power generation economics; Power quality; Process control; Voltage fluctuations; Warranties;
fLanguage
English
Journal_Title
Industry Applications Magazine, IEEE
Publisher
ieee
ISSN
1077-2618
Type
jour
DOI
10.1109/2943.877842
Filename
877842
Link To Document