• DocumentCode
    1398378
  • Title

    Designing electronic devices to survive power-quality events

  • Author

    McEachern, Alex

  • Author_Institution
    Power Stand. Lab., Emeryville, CA, USA
  • Volume
    6
  • Issue
    6
  • fYear
    2000
  • Firstpage
    66
  • Lastpage
    69
  • Abstract
    The most common electric power-quality events-sags, swells, and transients-have been identified and quantified in national studies by US utilities and the Electric Power Research Institute (EPRI). Utilities are making efforts to improve power quality; however, it also makes sense to design loads, such as appliances, process control computers, and semiconductor manufacturing systems, to tolerate common power-quality events. This article suggests some design criteria for "power-quality-tolerant" designs, and suggests ways of achieving them. Warranty and service costs will be reduced and customer satisfaction increased
  • Keywords
    electronic equipment manufacture; power supply quality; power system transients; process control; EPRI; Electric Power Research Institute; US utilities; electronic devices; power-quality events; process control computers; sags; semiconductor manufacturing systems; service costs; swells; transients; warranty costs; Costs; Customer satisfaction; Environmental economics; Home appliances; Microwave ovens; Power generation economics; Power quality; Process control; Voltage fluctuations; Warranties;
  • fLanguage
    English
  • Journal_Title
    Industry Applications Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1077-2618
  • Type

    jour

  • DOI
    10.1109/2943.877842
  • Filename
    877842