Title :
Virtualized ECC: Flexible Reliability in Main Memory
Author :
Yoon, Doe Hyun ; Erez, Mattan
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Texas at Austin, Austin, TX, USA
Abstract :
Virtualized error checking and correcting (ECC) is a scheme that virtualizes memory-error correction. Unlike traditional uniform ECC, which provides a fixed level of error tolerance, virtualized ECC enables flexible memory protection by mapping redundant information needed for correcting errors onto the memory namespace. Additionally, virtualized ECC enables error-correction mechanisms that can adapt to user and system demands.
Keywords :
DRAM chips; error correction; error detection; fault tolerant computing; redundancy; virtualisation; DRAM chip; error checking and correction; memory error correction; redundant memory mapping; virtualized ECC; ECC; Error correction; error checking and correcting; fault tolerance; memory systems; reliability;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2010.103
