• DocumentCode
    1398434
  • Title

    Voltage Noise in Production Processors

  • Author

    Reddi, Vijay Janapa ; Kanev, Svilen ; Kim, Wonyoung ; Campanoni, Simone ; Smith, Michael D. ; Wei, Gu-Yeon ; Brooks, David

  • Volume
    31
  • Issue
    1
  • fYear
    2011
  • Firstpage
    20
  • Lastpage
    28
  • Abstract
    Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.
  • Keywords
    computer architecture; coprocessors; integrated circuit design; integrated circuit noise; multiprocessing systems; processor design; production core 2 duo processor; resilient architecture design; voltage noise; Software thread scheduling; dI/dt; inductive noise; processor design; voltage margins;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2010.104
  • Filename
    5661758
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1398434