Title :
Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
Author :
Monden, Akito ; Okahara, Satoshi ; Manabe, Yuki ; Matsumoto, Ken-ichi
Author_Institution :
Nara Inst. of Sci. & Technol., Nara, Japan
Abstract :
To increase productivity, programmers often unwittingly violate open source software licenses by reusing code fragments, or clones. The authors explore metrics that can reveal the existence or absence of code reuse and apply these metrics to 1,225 open source product pairs.
Keywords :
industrial property; public domain software; software metrics; software reusability; clone metrics; code fragment reuse; open source licensing violation; software license; open source software reuse; product metrics; software licensing violations;
Journal_Title :
Software, IEEE
DOI :
10.1109/MS.2010.159
