DocumentCode :
1398481
Title :
Optimization of multi-wavelength interdigital dielectrometry instrumentation and algorithms
Author :
Mamishev, A.V. ; Lesieutre, B.C. ; Zahn, M.
Author_Institution :
Lab. for Electromagn. & Electron. Syst., MIT, Cambridge, MA, USA
Volume :
5
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
408
Lastpage :
420
Abstract :
Interdigital frequency-wavelength dielectrometry can be used to measure the dielectric permittivity and conductivity of insulating materials. The complex dielectric permittivity is directly related to other material properties, such as moisture content, temperature, concentration of impurities and additives, density, aging status, etc. The analysis of spatial and temporal variations of these properties lends valuable insights into physical phenomena which take place in electrical equipment, provides instrumentation for system monitoring and diagnostics, and can be used for optimization of design and performance of electrical apparatus. The optimization of various aspects of this technology is described in this paper. Improvement of performance is achieved through variation of geometrical design, materials, manufacturing processes, and electronic circuitry. Accumulated effects of non-ideal geometry of the experimental setup and the sensor itself are accounted for through empirical measurements, calibration, and use of finite-element calculations. Three distinct operating modes are developed: floating voltage with grounded backplane, floating voltage with guarded backplane, and short circuit current. Measurements reveal that the interfacial contact quality has a strong influence on the sensor´s response. Gain/phase measurements over the frequency range 5 mHz to 10 kHz agree well with theoretical calculations on the interfacial contact quality. Full-frequency measurements for several liquid and solid dielectrics are shown to have a good match with theoretical predictions
Keywords :
electrical conductivity measurement; finite element analysis; insulation testing; permittivity measurement; 5 mHz to 10 kHz; algorithm; calibration; conductivity; dielectric permittivity; electrical equipment; finite element method; floating voltage; gain measurement; grounded backplane; guarded backplane; instrumentation; insulating material; interfacial contact quality; liquid dielectric; multi-wavelength interdigital dielectrometry; optimization; phase measurement; sensor; short circuit current; solid dielectric; system diagnostics; system monitoring; Backplanes; Conducting materials; Conductivity measurement; Dielectric liquids; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency measurement; Permittivity measurement; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.689431
Filename :
689431
Link To Document :
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