DocumentCode :
1398523
Title :
A phenomenological aging model for combined thermal and electrical stress [comment and reply]
Author :
Simoni, L.
Volume :
5
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
463
Lastpage :
465
Abstract :
For original paper see A.C. Gjaerde, IEEE DEIS, vol.4, no.6, pp.674-80, 1997. In the original paper, Gjaerde proposed a life model for insulating materials under combined stress, where the combined effect of temperature and PD is considered. The latter is taken into account by means of measurements of void gas pressure. The purpose of this comment is not to contest Gjaerde´s model from the point of view of its inability to fit all experimental results, but to show that the model can be derived from the well-known model proposed by this author, but with several inadmissible simplifications and errors. A reply by Gjaerde to the comment is included
Keywords :
ageing; insulating materials; partial discharges; Gjaerde model; PD; Simoni model; electrical stress; insulating material; life model; phenomenological aging model; thermal stress; void gas pressure; Aging; Dielectrics and electrical insulation; Electric variables measurement; Mathematical model; Stress measurement; Temperature; Testing; Thermal engineering; Thermal stresses; Threshold voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.689437
Filename :
689437
Link To Document :
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