DocumentCode
1398565
Title
A Response to "Room Temperature Single-Electron Transistor Featuring Gate-Enhanced on-State Current"
Author
Joyce, Robin A. ; Lee, Yen-Chun ; Orlov, Alexei O. ; Snider, Gregory L.
Author_Institution
University of Notre Dame, Notre Dame, IN, USA
Volume
31
Issue
3
fYear
2010
fDate
3/1/2010 12:00:00 AM
Firstpage
249
Lastpage
249
Abstract
The authors of the above-named work [ibid., vol. 30, no. 7, pp. 766??768, Jul. 2009] report a single-electron transistor (SET) operating at room temperature, improving upon previously published work. It is argued that while the fabrication method is a novel and promising approach to SET fabrication, the data presented do not support the assertion that Coulomb blockade (CB) has been observed or that an SET has been demonstrated. The fact that the authors are unable to attribute their findings to CB "orthodox theory" is not surprising, as other phenomena are more likely responsible. Confinement to the cryogenic temperature regime has been one of the biggest technological struggles facing the advancement and proliferation of single electronics, and claims that these significant challenges can be overcome must be carefully validated and understood.
Keywords
Capacitance; Cryogenics; Electric breakdown; Fabrication; Leakage current; Single electron transistors; Temperature; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2009.2038498
Filename
5401055
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