• DocumentCode
    1398565
  • Title

    A Response to "Room Temperature Single-Electron Transistor Featuring Gate-Enhanced on-State Current"

  • Author

    Joyce, Robin A. ; Lee, Yen-Chun ; Orlov, Alexei O. ; Snider, Gregory L.

  • Author_Institution
    University of Notre Dame, Notre Dame, IN, USA
  • Volume
    31
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    249
  • Lastpage
    249
  • Abstract
    The authors of the above-named work [ibid., vol. 30, no. 7, pp. 766??768, Jul. 2009] report a single-electron transistor (SET) operating at room temperature, improving upon previously published work. It is argued that while the fabrication method is a novel and promising approach to SET fabrication, the data presented do not support the assertion that Coulomb blockade (CB) has been observed or that an SET has been demonstrated. The fact that the authors are unable to attribute their findings to CB "orthodox theory" is not surprising, as other phenomena are more likely responsible. Confinement to the cryogenic temperature regime has been one of the biggest technological struggles facing the advancement and proliferation of single electronics, and claims that these significant challenges can be overcome must be carefully validated and understood.
  • Keywords
    Capacitance; Cryogenics; Electric breakdown; Fabrication; Leakage current; Single electron transistors; Temperature; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2009.2038498
  • Filename
    5401055