DocumentCode :
1398935
Title :
Analysis and Diagnosis of Open-Circuit Faults in Matrix Converters
Author :
Cruz, Sérgio ; Ferreira, Marco ; Mendes, André ; Cardoso, António
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
Volume :
58
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1648
Lastpage :
1661
Abstract :
The monitoring of power converters is critical for obtaining systems with self-diagnostic capabilities and fault-tolerant features. This paper presents an analytical work concerning the operation of matrix converters (MCs) under the presence of open-circuit faults and discusses the applicability of a method for the diagnosis of this type of failures. The proposed method uses the absolute values of nine modulated error voltages for the continuous monitoring of the condition of the bidirectional switches of an MC. This method allows a fast detection and location of the faulty switches, independent of the modulation strategy of the converter, its voltage transfer ratio, output frequency, or type of load connected to it, both in steady-state and transient regimes. The theory, validated by simulation and experimental results, demonstrates the applicability of the proposed technique for the diagnosis of faults in MCs.
Keywords :
AC-AC power convertors; condition monitoring; fault diagnosis; fault tolerance; matrix convertors; power electronics; reliability; switches; bidirectional switch; condition monitoring; converter modulation; error voltage modulation; fault-tolerant feature; faulty switch; matrix converter; open-circuit fault analysis; open-circuit fault diagnosis; power converter; self-diagnostic capability; voltage transfer ratio; Circuit faults; Insulated gate bipolar transistors; Logic gates; Matrix converters; Switches; Voltage measurement; AC–AC power conversion; fault diagnosis; matrix converters (MCs); modulated error voltages (MEVs); open-circuit faults; power electronics; reliability;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2010.2098356
Filename :
5661831
Link To Document :
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