Title :
Interaction of relativistic electrons with ultrashort laser pulses: generation of femtosecond X-rays and microprobing of electron beams
Author :
Leemans, W.P. ; Schoenlein, R.W. ; Volfbeyn, P. ; Chin, A.H. ; Glover, T.E. ; Balling, P. ; Zolotorev, M. ; Kim, K.-J. ; Chattopadhyay, S. ; Shank, C.V.
Author_Institution :
Div. of Fusion Res., California Univ., Berkeley, CA, USA
fDate :
11/1/1997 12:00:00 AM
Abstract :
The interaction of relativistic electrons with terawatt femtosecond laser pulses is reviewed with emphasis on how the scattering process can be used as a source of ultrashort X-ray pulses and as a time-resolved diagnostic for measuring transverse and longitudinal phase space distributions of an electron beam with microns spatial and subpicosecond temporal resolution. Recent experimental results are presented in which 90° Thomson scattering was utilized to generate 300 fs duration pulses of X-rays with peak energy of 30 keV. It is shown that, through analysis of the scattered X-ray beam properties, transverse and longitudinal distributions of the electron beam can be obtained
Keywords :
X-ray production; backscatter; electron beam focusing; electron beams; high-speed optical techniques; particle beam diagnostics; 30 keV; 300 fs; Thomson scattering; electron beam; electron beams; femtosecond X-rays; longitudinal distributions; longitudinal phase space distributions; microprobing; peak energy; relativistic electrons; scattered X-ray beam properties; scattering process; spatial temporal resolution; subpicosecond temporal resolution; terawatt femtosecond laser pulses; time-resolved diagnostics; transverse distributions; transverse phase space distributions; ultrashort X-ray pulses; ultrashort laser pulses; Electron beams; Energy resolution; Extraterrestrial measurements; Optical pulses; Phase measurement; Pulse generation; Pulse measurements; Spatial resolution; X-ray lasers; X-ray scattering;
Journal_Title :
Quantum Electronics, IEEE Journal of
