Title :
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
Author :
Gil-Tomas, D. ; Gracia-Moran, J. ; Baraza-Calvo, J.-Carlos ; Saiz-Adalid, Luis-J. ; Gil-Vicente, P.-J.
Author_Institution :
Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
Abstract :
Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats.
Keywords :
fault simulation; integrated circuit reliability; microprocessor chips; deep-submicron integrated circuits; fault injection; fault injection simulation; fault mitigation technique; intermittent fault impact; microprocessor faults; Circuit faults; Fault tolerance; Hardware design languages; Microprocessors; Reduced instruction set computing; Reliability; Simulation; Transient analysis; Fault injection; Hardware description languages; Reliability; Simulation; Testing and Fault Tolerance; Verification;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.2179514
