• DocumentCode
    1399143
  • Title

    Charge injection of analogue CMOS switches

  • Author

    Eichenberger, C. ; Guggenbühl, W.

  • Author_Institution
    HMT Microelectron. AG, Brugg, Switzerland
  • Volume
    138
  • Issue
    2
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    155
  • Lastpage
    159
  • Abstract
    The clock-feedthrough phenomenon in sample-and-hold circuits using complementary MOS transistor switches is discussed in detail. The analysis starts with a generalised clock-feedthrough formula for the single MOS switch and is extended to a discussion of the basic CMOS sample-and-hold circuit operated over a wide signal and clock delay range. Simple formulas for the estimation of the clock feedthrough voltages are given. Experimental results obtained with custom integrated test chips realised with a 3 μm CMOS process are reported and found to be in good agreement with the theory. Simultaneous switching of transistor pairs with identical geometry at slow speed is recommended for optimal clock-feedthrough performance in CMOS switches
  • Keywords
    CMOS integrated circuits; clocks; sample and hold circuits; switched capacitor networks; 3 micron; analogue CMOS switches; clock delay range; clock-feedthrough phenomenon; custom integrated test chips; geometry; sample-and-hold circuits; slow speed; transistor pairs;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0956-3768
  • Type

    jour

  • Filename
    87837