DocumentCode
1399253
Title
Tuning Support Vector Machines for Minimax and Neyman-Pearson Classification
Author
Davenport, Mark A. ; Baraniuk, Richard G. ; Scott, Clayton D.
Author_Institution
Dept. of Stat., Stanford Univ., Stanford, CA, USA
Volume
32
Issue
10
fYear
2010
Firstpage
1888
Lastpage
1898
Abstract
This paper studies the training of support vector machine (SVM) classifiers with respect to the minimax and Neyman-Pearson criteria. In principle, these criteria can be optimized in a straightforward way using a cost-sensitive SVM. In practice, however, because these criteria require especially accurate error estimation, standard techniques for tuning SVM parameters, such as cross-validation, can lead to poor classifier performance. To address this issue, we first prove that the usual cost-sensitive SVM, here called the 2C-SVM, is equivalent to another formulation called the 2nu-SVM. We then exploit a characterization of the 2nu-SVM parameter space to develop a simple yet powerful approach to error estimation based on smoothing. In an extensive experimental study, we demonstrate that smoothing significantly improves the accuracy of cross-validation error estimates, leading to dramatic performance gains. Furthermore, we propose coordinate descent strategies that offer significant gains in computational efficiency, with little to no loss in performance.
Keywords
error analysis; estimation theory; minimax techniques; pattern classification; statistical analysis; support vector machines; 2C-SVM; 2nu-SVM parameter; Neyman-Pearson classification; SVM classifiers; cost sensitive SVM; cross validation; error estimation; minimax criteria; support vector machine tuning; Computational efficiency; Costs; Design optimization; Error analysis; Minimax techniques; Performance gain; Performance loss; Smoothing methods; Support vector machine classification; Support vector machines; Minimax classification; Neyman-Pearson classification; error estimation; parameter selection.; support vector machine;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2010.29
Filename
5401162
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