DocumentCode :
1399363
Title :
A hysteresis model for an orthogonal thin-film magnetometer
Author :
De Ridder, Rene M. ; Fluitman, Jan H.
Author_Institution :
Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands
Volume :
26
Issue :
4
fYear :
1990
fDate :
7/1/1990 12:00:00 AM
Firstpage :
1237
Lastpage :
1245
Abstract :
The operation of a ferromagnetic thin-film magnetometer using the anisotropic magnetoresistance effect in a permalloy film is discussed. Measurements showed the presence of a hysteresis effect not predicted by available models. It is shown that the sensitivity of the magnetometer is predicted by applying F.S. Greene and R.B. Yarbrough´s (1970) orthogonal susceptibility model, and that the hysteresis can be explained by assuming dispersion in the magnitude of anisotropy. The orthogonal susceptibility model must be evaluated numerically, accounting for a finite driving field. The effect of an inhomogeneous demagnetizing field in the film is discussed in relation to magnitude dispersion of the anisotropy
Keywords :
Permalloy; ferromagnetic properties of substances; magnetic hysteresis; magnetic susceptibility; magnetic thin film devices; magnetometers; anisotropic magnetoresistance effect; anisotropy magnitude dispersion; ferromagnetic thin-film magnetometer; hysteresis model; inhomogeneous demagnetizing field; orthogonal susceptibility model; permalloy film; sensitivity; Anisotropic magnetoresistance; Helium; Hysteresis; Magnetic anisotropy; Magnetic films; Magnetometers; Perpendicular magnetic anisotropy; Predictive models; Saturation magnetization; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.54014
Filename :
54014
Link To Document :
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