Title :
Predicting number of hospitalization days based on health insurance claims data using bagged regression trees
Author :
Yang Xie ; Schreier, Gunter ; Chang, David C. W. ; Neubauer, Sandra ; Redmond, Stephen J. ; Lovell, Nigel H.
Author_Institution :
Grad. Sch. of Biomed. Eng., UNSW Australia, Sydney, NSW, Australia
Abstract :
Healthcare administrators worldwide are striving to both lower the cost of care whilst improving the quality of care given. Therefore, better clinical and administrative decision making is needed to improve these issues. Anticipating outcomes such as number of hospitalization days could contribute to addressing this problem. In this paper, a method was developed, using large-scale health insurance claims data, to predict the number of hospitalization days in a population. We utilized a regression decision tree algorithm, along with insurance claim data from 300,000 individuals over three years, to provide predictions of number of days in hospital in the third year, based on medical admissions and claims data from the first two years. Our method performs well in the general population. For the population aged 65 years and over, the predictive model significantly improves predictions over a baseline method (predicting a constant number of days for each patient), and achieved a specificity of 70.20% and sensitivity of 75.69% in classifying these subjects into two categories of `no hospitalization´ and `at least one day in hospital´.
Keywords :
decision making; decision trees; health care; learning (artificial intelligence); medical administrative data processing; regression analysis; administrative decision making; bagged regression trees; clinical decision making; health care administrators; health insurance claims data; hospitalization days; medical admissions data; regression decision tree algorithm; Accuracy; Feature extraction; Hospitals; Predictive models; Sociology; Statistics;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
DOI :
10.1109/EMBC.2014.6944181