• DocumentCode
    1399596
  • Title

    Semiclassical model of semiconductor laser noise and amplitude noise squeezing. II. Application to complex laser structures

  • Author

    Vey, Jean-Luc ; Gallion, Philippe

  • Volume
    33
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    2105
  • Lastpage
    2110
  • Abstract
    For pt.I see ibid., vol.33, no.11, p.2097-2104 (1997). We present noise studies of distributed feedback (DFB) laser structures, where spatial hole burning (SHB) plays a key role performed using the model described in part I of this paper with particular emphasis on the influence of SHB, on the coupling coefficient κL, and on the laser facet reflectivities. These structures exhibit high amplitude noise and the possible noise reduction is strongly reduced compared to Fabry-Perot structures. Distributed Bragg reflector (DBR) lasers are better candidates even if their performances are also strictly determined by SHB and the loss in the Bragg reflector. Finally, limitations due to gain suppression are demonstrated for such complex lasers structures. We conclude on the optimum laser structure for amplitude squeezed states generation
  • Keywords
    distributed Bragg reflector lasers; distributed feedback lasers; laser noise; laser theory; optical hole burning; optical squeezing; semiconductor device models; semiconductor lasers; DBR; DFB; amplitude noise squeezing; amplitude squeezed states generation; complex laser structures; coupling coefficient; distributed Bragg reflector lasers; distributed feedback laser structures; gain suppression; high amplitude noise; laser facet reflectivities; loss; noise reduction; optimum laser structure; semiclassical model; semiconductor laser noise; spatial hole burning; Distributed Bragg reflectors; Distributed feedback devices; Laser feedback; Laser modes; Laser noise; Noise level; Noise reduction; Optical coupling; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.641326
  • Filename
    641326