DocumentCode
1400004
Title
Group theoretic signature analysis
Author
Bose, Bella
Author_Institution
Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
Volume
39
Issue
11
fYear
1990
fDate
11/1/1990 12:00:00 AM
Firstpage
1398
Lastpage
1403
Abstract
A new class of data-compression techniques called group-theoretic signature analysis (GTSA) for testing a logic network is proposed, and the fault coverage of the method is analyzed. This method is a generalization of accumulator compression testing. Built-in-self-test for processor environments is feasible with GTSA
Keywords
built-in self test; data compression; logic circuits; logic testing; accumulator compression testing; built-in self-test; data-compression techniques; fault coverage; group-theoretic signature analysis; logic network; processor environments; testing; Bipartite graph; Built-in self-test; Circuit faults; Circuit testing; Data compression; Logic testing; Routing; Switches; Very large scale integration; Wires;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.61051
Filename
61051
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