• DocumentCode
    1400369
  • Title

    High fmax InP double heterojunction bipolar transistors with chirped InGaAs/InP superlattice base-collector junction grown by CBE

  • Author

    Yang, K. ; Munns, G.O. ; Haddad, G.I.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    18
  • Issue
    11
  • fYear
    1997
  • Firstpage
    553
  • Lastpage
    555
  • Abstract
    We report the performance of InP Double Heterojunction Bipolar Transistors (DHBT´s) with a chirped InGaAs/InP superlattice B-C junction grown by CBE. The B-C junction of the DHBT was graded with a 10-period InGaAs/InP chirped superlattice (CSL) between the InGaAs base and the lightly doped InP collector. A highly doped thin layer was also included at the end of the CSL to offset the quasi-electric field arising from the grade and suppress further the carrier blocking effect across the B-C heterojunction. The InP/InGaAs CSL DHBT demonstrated a high BV/sub CEO/ of 18.3 V with a typical current gain of 55 with minimal carrier blocking up to high current densities. Maximum cutoff frequencies of fmax=146 GHz and f/sub r/=71 GHz were obtained from the fabricated 2×10 μm2-emitter DHBT.
  • Keywords
    III-V semiconductors; S-parameters; chemical beam epitaxial growth; gallium arsenide; heterojunction bipolar transistors; indium compounds; millimetre wave bipolar transistors; millimetre wave power transistors; power bipolar transistors; semiconductor growth; semiconductor superlattices; 146 GHz; 18.3 V; 71 GHz; CBE growth; Gummel plots; InGaAs base; InGaAs-InP; InP; InP double heterojunction bipolar transistors; breakdown voltage; carrier blocking effect; chirped InGaAs/InP superlattice base-collector junction; common-emitter I-V characteristics; current gain; high current densities; highly doped thin layer; lightly doped InP collector; maximum cutoff frequencies; quasi-electric field offset; small-signal S-parameters; Bipolar transistors; Chirp; Cutoff frequency; Double heterojunction bipolar transistors; Electric breakdown; Indium compounds; Indium gallium arsenide; Indium phosphide; Microelectronics; Superlattices;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.641443
  • Filename
    641443