DocumentCode
1400448
Title
Bringing up a chip on the cheap
Author
Wachs, Matthias ; Shacham, O. ; Asgar, Z. ; Firoozshahian, A. ; Richardson, S. ; Horowitz, Mark
Author_Institution
Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
Volume
29
Issue
6
fYear
2012
Firstpage
57
Lastpage
65
Abstract
Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip.
Keywords
storage management chips; Stanford Smart Memories; cost constrained environment; debugging; silicon samples; time consuming task; transistor research chip; Debugging; Field programmable gate arrays; System-on-a-chip; Testing; BEE2; Bringup; FPGA; JTAG; Smart Memories;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.2179849
Filename
6105527
Link To Document