• DocumentCode
    1400633
  • Title

    A steady-state throughput analysis of cluster tools: dual-blade versus single-blade robots

  • Author

    Venkatesh, Srilakshmi ; Davenport, Rob ; Foxhoven, Pattie ; Nulman, Jaim

  • Author_Institution
    Dept. of Appl. Mater., Metal Deposition Products Group, Santa Clara, CA, USA
  • Volume
    10
  • Issue
    4
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    418
  • Lastpage
    424
  • Abstract
    An analysis of throughput in a cluster tool with a dual-blade robot operating in steady-state mode is presented. The analysis is based on a single-wafer serial processing cluster tool. Two types of schedules are distinguished, called transport-bound schedules and process-bound schedules. In a transport-bound schedule changes in process times do not affect the throughput of the cluster tool, and denotes the maximum throughput achievable in the cluster tool. In a process-bound schedule, the process time predominates the effect on the throughput. The analysis indicates that a dual-blade robot improves the throughput of the cluster tool over a single-blade robot under process-bound conditions. Under process-bound conditions, a cluster tool with a single-blade robot would need to double the speed of the robot, compared with a dual-blade robot of equivalent speed, to achieve similar throughput. Under transport-bound conditions, the throughput of the cluster tool is the same for both dual-blade and single-blade cluster tools
  • Keywords
    cluster tools; flexible manufacturing systems; industrial robots; integrated circuit manufacture; production control; robots; semiconductor technology; cluster tools; dual-blade robots; process-bound schedules; semiconductor fabrication facilities; single-blade robots; single-wafer serial processing tool; steady-state throughput analysis; transport-bound schedules; Associate members; Blades; Fabrication; Flexible manufacturing systems; Job shop scheduling; Manufacturing automation; Robotics and automation; Robots; Steady-state; Throughput;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.641483
  • Filename
    641483