DocumentCode :
1400664
Title :
A theory of shot noise in quantum wells and applications in resonant tunneling heterojunction bipolar transistors
Author :
Han, Jun ; Barnes, Frank S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Volume :
38
Issue :
2
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
237
Lastpage :
241
Abstract :
Some semiclassical arguments are presented to show that the noise associated with the current through a resonant tunnel (RT) diode is reduced by the feedback through the modulation of the barriers by the space charge in the well, and at high frequencies by the reduction in the velocity spread. Theoretical calculations of shot noise are carried out on a double-barrier, one-well structure. The results show that the noise power is a function of the energy bandwidth of the transmitted electrons and that the noise may be significantly reduced by the quantum wells. These results can be applied to heterojunction bipolar transistors that contain a quantum well, and it is shown that these resonant tunneling heterojunction bipolar transistors (RTHBTs) should have a lower noise figure than homojunction transistors
Keywords :
electron device noise; equivalent circuits; frequency-domain analysis; heterojunction bipolar transistors; random noise; resonant tunnelling devices; semiconductor device models; semiconductor quantum wells; time-domain analysis; RTHBT; barrier modulation; double barrier structure; electron energy bandwidth; equivalent circuit; frequency domain analysis; noise analysis; noise figure; noise power; quantum wells; resonant tunnel diode; resonant tunneling heterojunction bipolar transistors; semiclassical theory; semiconductor devices; shot noise theory; space charge; time domain approach; velocity spread; Acoustical engineering; Bandwidth; Diodes; Feedback; Frequency; Heterojunction bipolar transistors; Noise reduction; Quantum mechanics; Resonant tunneling devices; Space charge;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.69900
Filename :
69900
Link To Document :
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