DocumentCode :
140113
Title :
Estimating blur at the brain gray-white matter boundary for FCD detection in MRI
Author :
Xiaoxia Qu ; Platisa, Ljiljana ; Despotovic, Ivana ; Kumcu, Asli ; Tingzhu Bai ; Deblaere, Karel ; Philips, Wilfried
Author_Institution :
Beijing Inst. of Technol., Beijing, China
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
3321
Lastpage :
3324
Abstract :
Focal cortical dysplasia (FCD) is a frequent cause of epilepsy and can be detected using brain magnetic resonance imaging (MRI). One important MRI feature of FCD lesions is the blurring of the gray-white matter boundary (GWB), previously modelled by the gradient strength. However, in the absence of additional FCD descriptors, current gradient-based methods may yield false positives. Moreover, they do not explicitly quantify the level of blur which prevents from using them directly in the process of automated FCD detection. To improve the detection of FCD lesions displaying blur, we develop a novel algorithm called iterating local searches on neighborhood (ILSN). The novelty is that it measures the width of the blurry region rather than the gradient strength. The performance of our method is compared with the gradient magnitude method using precision and recall measures. The experimental results, tested on MRI data of 8 real FCD patients, indicate that our method has higher ability to correctly identify the FCD blurring than the gradient method.
Keywords :
biomedical MRI; brain; medical disorders; medical image processing; optimisation; FCD blurring; FCD detection; FCD lesions; MRI; blurry region width; brain gray-white matter boundary; brain magnetic resonance imaging; epilepsy; focal cortical dysplasia; iterating local searches on neighborhood algorithm; magnetic resonance imaging; Brain modeling; Educational institutions; Epilepsy; Hidden Markov models; Image segmentation; Lesions; Magnetic resonance imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6944333
Filename :
6944333
Link To Document :
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