DocumentCode :
1401355
Title :
Long lossy lines (L3) and their impact upon large chip performance
Author :
Davidson, Evan E. ; McCredie, Bradley D. ; Vilkelis, Walter V.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Volume :
20
Issue :
4
fYear :
1997
fDate :
11/1/1997 12:00:00 AM
Firstpage :
361
Lastpage :
375
Abstract :
The semiconductor industry expects the performance of microprocessors to continue at its current rate of improvement; i.e. clock rates should double every two to three years. This is a commendable goal but it is also fair to question whether this is an achievable goal. The fundamental problem is that as groundrules are reduced, the natural tendency is to make smaller conductor cross-sectional areas. The result is a high resistance line that exhibits slow wave propagation effects. This reduces the general performance expectations. As circuits become faster and denser on the chip, line delays become greater than expected. This problem is analyzed and potential chip and packaging solutions are offered. Clock rate predictions for various design and process options are made. A tactical recommendation to consider a total packaged electronics solution is presented
Keywords :
delays; integrated circuit interconnections; integrated circuit packaging; microprocessor chips; multichip modules; probability; statistical analysis; timing; clock rate predictions; conductor cross-sectional area; large chip performance; line delays; long lossy lines; microprocessors; packaging; slow wave propagation effects; Circuits; Clocks; Conductors; Delay lines; Electronics industry; Electronics packaging; Extrapolation; Microprocessors; Performance loss; Process design;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.641504
Filename :
641504
Link To Document :
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