DocumentCode :
1401413
Title :
Use of surface insulation resistance and contact angle measurements to characterize the interactions of three water soluble fluxes with FR-4 substrates
Author :
Jachim, Jenny A. ; Freeman, Garth B. ; Turbini, Laura J.
Author_Institution :
Air & Radiat. Technol. Branch, Environ. Protection Agency, Atlanta, GA, USA
Volume :
20
Issue :
4
fYear :
1997
fDate :
11/1/1997 12:00:00 AM
Firstpage :
443
Lastpage :
451
Abstract :
Soldering flux chemistry and its interaction with the printed wiring board have been important reliability concerns for a number of years. Post Vietnam investigation of military hardware revealed corrosion in some areas. The test method most frequently used to assess the corrosion potential of flux residues is surface insulation resistance (SIR) testing. This paper gives some background on surface insulation resistance testing and reports on its application to three different water soluble fluxes. The appearance of surface dendrites is linked to test procedures that allowed water condensation on the board surface. Subsurface conductive anodic filament formation is associated with the use of fluxes which contained polyglycols. The use of contact angle measurements to assess the effect of the soldering flux residues on the board is demonstrated
Keywords :
circuit reliability; contact angle; corrosion testing; dendrites; printed circuits; soldering; surface contamination; FR-4 substrates; PWB surface; contact angle measurements; corrosion; flux residues; polyglycols; printed wiring board; reliability; soldering flux chemistry; subsurface conductive anodic filament formation; surface dendrites; surface insulation resistance testing; water condensation; water soluble fluxes; Chemistry; Contact resistance; Corrosion; Electrical resistance measurement; Goniometers; Hardware; Insulation testing; Soldering; Surface resistance; Wiring;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.641513
Filename :
641513
Link To Document :
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