Distributed grating sensors using low-coherence reflectometry

Author

Volanthen, Mark ; Geiger, Harald ; Dakin, John P.

Author_Institution

Optoelectron. Res. Centre, Southampton Univ., UK

Volume

15

Issue

11

fYear

1997

fDate

11/1/1997 12:00:00 AM

Firstpage

2076

Lastpage

2082

Abstract

Distributed grating sensors have recently been interrogated with low-coherence reflectometry. Initial results have been enhanced using two new and versatile configurations. The first system tracks the wavelength using a closed-loop scheme, while the second system scans the distance using an open-loop approach. Arbitrary strain and temperature profiles along gratings have been examined with 300 μm spatial resolution and 5.4 με/√Hz accuracy. A theoretical model of the interrogation technique is derived and the predicted performance limits are examined experimentally

Keywords

diffraction gratings; fibre optic sensors; light coherence; light interferometry; measurement errors; reflectometry; strain measurement; strain sensors; temperature measurement; accuracy; arbitrary strain profiles; closed-loop scheme; distributed grating sensors; fibre Bragg grating sensors; interrogation technique; low-coherence reflectometry; open-loop approach; performance limits; spatial resolution; temperature profiles; versatile configurations; wavelength tracking; Bragg gratings; Capacitive sensors; Fiber gratings; Optical fiber sensors; Optical filters; Optical interferometry; Reflectometry; Strain measurement; Temperature sensors; Wavelength measurement;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.641525

Filename

641525