Estimation of waveguide phase error in silica-based waveguides

Author

Goh, Takashi ; Suzuki, Senichi ; Sugita, Akio

Author_Institution

NTT Opto-Electron. Labs., Ibaraki, Japan

Volume

15

Issue

11

fYear

1997

fDate

11/1/1997 12:00:00 AM

Firstpage

2107

Lastpage

2113

Abstract

A new estimation method is proposed in order to clarify waveguide phase error factors. Using the proposed method, it is possible to analyze such factors as core size error and refractive index error, which cause optical phase error in waveguides. This method is applied to silica-based waveguides to estimate the waveguide phase error. This revealed an average core size error of 2.1×10^-3 μm and an average refractive index error of 1.9×10^-6. Finally, based on the measured phase error values, the optimum arrayed-waveguide grating (AWG) configuration is considered with a view to achieving low crosstalk

Keywords

arrays; diffraction gratings; error analysis; optical crosstalk; optical planar waveguides; optical waveguide theory; refractive index; silicon compounds; wavelength division multiplexing; SiO₂; arrayed-waveguide grating; core size error; estimation method; low crosstalk; optical WDM network system; optimum AWG configuration; refractive index error; silica-based waveguides; waveguide phase error; Arrayed waveguide gratings; Optical crosstalk; Optical device fabrication; Optical filters; Optical refraction; Optical variables control; Optical waveguides; Phase estimation; Phase measurement; Wavelength division multiplexing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.641530

Filename

641530