• DocumentCode
    1401577
  • Title

    Analysis of end-pumped Nd:Ti:LiNbO3 microchip waveguide Fabry-Perot lasers

  • Author

    Lee, Ching-Ting ; Sheu, Lih-Gen

  • Author_Institution
    Inst. of Opt. Sci., Nat. Central Univ., Chung-Li, Taiwan
  • Volume
    15
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    2147
  • Lastpage
    2153
  • Abstract
    A self-consistent analysis of end-pumped Nd:Ti:LiNbO3 microchip waveguide lasers based on the fast Fourier transform beam propagation method (FFT-BPM) has been proposed. The algorithm of the model allows one to describe the laser gain and pump absorption in terms of the complex atomic susceptibility for the case of the Nd3+ ions. Considering the interference effects between the forward and backward light waves, the population inversion longitudinal and transversal spatial effects can be simulated. The laser characteristics of the Nd:Ti:LiNbO3 waveguide laser correlate well with the experimental data and theoretical results. The design rules for the optimized microchip laser are also developed by using the proposed model
  • Keywords
    Fabry-Perot resonators; fast Fourier transforms; laser theory; lithium compounds; neodymium; optical hole burning; optical pumping; population inversion; solid lasers; waveguide lasers; FFT-BPM; LiNbO3:Nd,Ti; Nd3+ ions; backward light waves; complex atomic susceptibility; design rules; end-pumped Nd:Ti:LiNbO3 microchip waveguide Fabry-Perot lasers; fast Fourier transform beam propagation method; forward light waves; interference effects; laser characteristics; laser gain; longitudinal spatial effects; optimized microchip laser; population inversion; pump absorption; self-consistent analysis; transversal spatial effects; Atom lasers; Fast Fourier transforms; Laser beams; Laser excitation; Laser modes; Laser theory; Microchip lasers; Optical propagation; Pump lasers; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.641536
  • Filename
    641536