• DocumentCode
    1402440
  • Title

    Capacitance computation for CPW discontinuities with finite metallization thickness by hybrid finite-element method

  • Author

    Chiu, Chien-Wen ; Wu, Ruey-Beei

  • Author_Institution
    Dept. of Electron. Eng., Jin-Wen Coll. of Bus. & Tech., Taiwan, China
  • Volume
    45
  • Issue
    4
  • fYear
    1997
  • fDate
    4/1/1997 12:00:00 AM
  • Firstpage
    498
  • Lastpage
    504
  • Abstract
    A variational equation is derived for the capacitances of coplanar waveguide (CPW) structures with finite metallization thickness. The equation is expressed in terms of the static potential in the slot region and is solved by applying the hybrid finite-element method (FEM). In the case of small metallization thickness, it is reduced to a perturbation formula for the incremental capacitances. Numerical results for the equivalent capacitances of various discontinuities with finite metallization thickness are presented and compared with measured data. The reasonable agreement between the measured data and the theoretical results validates the present approach. Being simple and computationally efficient, the method is suitable for dealing with extensive CPW discontinuity problems where the metallization thickness is not negligible
  • Keywords
    capacitance; coplanar waveguides; finite element analysis; metallisation; perturbation techniques; variational techniques; waveguide discontinuities; waveguide theory; CPW discontinuities; capacitance computation; coplanar waveguide structures; equivalent capacitances; finite metallization thickness; hybrid FEM; hybrid finite-element method; perturbation formula; slot region; static potential; variational equation; Capacitance; Coplanar waveguides; Equations; Finite difference methods; Finite element methods; MMICs; Metallization; Microstrip; Transmission line discontinuities; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.566629
  • Filename
    566629