• DocumentCode
    1402470
  • Title

    Optimum termination networks for tightly coupled microstrip lines under random and deterministic excitations

  • Author

    Amari, Smain ; Bornemann, Jens

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • Volume
    45
  • Issue
    10
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    1785
  • Lastpage
    1789
  • Abstract
    A general method to determine the termination network of multiple coupled lines for lowest input return loss is presented. Each line is connected to the ground and its nearest neighbors by resistors whose values are determined by minimizing the reflected power. It is demonstrated that under these conditions the optimum termination network depends on the excitation. The inequality of the modal propagation constants requires that the length of the lines be properly taken into account when designing a termination network which ensures maximum power delivery to the loads. Matching networks for five and seven coupled transmission lines under different excitations are presented. For the more practical case of unknown excitations, a design procedure based on minimizing the reflected power for independent random-incident voltage variables is presented
  • Keywords
    impedance matching; losses; microstrip circuits; microstrip lines; transmission line theory; design procedure; deterministic excitations; independent random-incident voltage variables; input return loss; loads; matching networks; maximum power delivery; modal propagation constants; multiple coupled line; optimum termination networks; random excitations; reflected power minimisation; tightly coupled microstrip lines; Admittance; Coupling circuits; Distributed parameter circuits; Microstrip; Nearest neighbor searches; Optical reflection; Power transmission lines; Resistors; Transmission line matrix methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.641730
  • Filename
    641730