Determination of complex permittivity of low-loss dielectrics

Author

Voelker, Robert H. ; Lei, Guang-Tsai ; Pan, Guang-Wen ; Gilbert, Barry K.

Author_Institution

Sun Microelectron. Div., Sun Microsystems Inc., Palo Alto, CA, USA

Volume

45

Issue

10

fYear

1997

fDate

10/1/1997 12:00:00 AM

Firstpage

1955

Lastpage

1960

Abstract

A new high-order-mode analytical method is described for calculating the frequency-dependent complex permittivity of a low-loss dielectric in a parallel-plate structure using a planar microwave circuit model. An analytical expression for the complex permittivity is derived in terms of the terminal impedance at a modal resonant frequency of the structure. The derivation provides physical and mathematical insight into the relation between complex permittivity and port impedance. The technique is validated by good agreement between manufacturer´s specifications and complex permittivity calculated from measurements near resonant frequencies for a printed circuit board (PCB)

Keywords

microwave measurement; permittivity measurement; printed circuits; frequency-dependent complex permittivity; high-order-mode analytical method; low-loss dielectric; parallel-plate structure; planar microwave circuit model; port impedance; printed circuit board; resonant frequency; Admittance; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Impedance; Microwave circuits; Microwave devices; Permittivity; Resonant frequency;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.641802

Filename

641802