Title :
Maximum Likelihood Estimation of Depth Maps Using Photometric Stereo
Author :
Harrison, Adam P. ; Joseph, Dileepan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
fDate :
7/1/2012 12:00:00 AM
Abstract :
Photometric stereo and depth-map estimation provide a way to construct a depth map from images of an object under one viewpoint but with varying illumination directions. While estimating surface normals using the Lambertian model of reflectance is well established, depth-map estimation is an ongoing field of research and dealing with image noise is an active topic. Using the zero-mean Gaussian model of image noise, this paper introduces a method for maximum likelihood depth-map estimation that accounts for the propagation of noise through all steps of the estimation process. Solving for maximum likelihood depth-map estimates involves an independent sequence of nonlinear regression estimates, one for each pixel, followed by a single large and sparse linear regression estimate. The linear system employs anisotropic weights, which arise naturally and differ in value to related work. The new depth-map estimation method remains efficient and fast, making it practical for realistic image sizes. Experiments using synthetic images demonstrate the method´s ability to robustly estimate depth maps under the noise model. Practical benefits of the method on challenging imaging scenarios are illustrated by experiments using the Extended Yale Face Database B and an extensive data set of 500 reflected light microscopy image sequences.
Keywords :
Gaussian processes; maximum likelihood estimation; photometry; regression analysis; stereo image processing; Lambertian model; Photometric stereo; depth-map estimation; extended Yale face database B; image noise; maximum likelihood estimation; nonlinear regression estimates; zero-mean Gaussian model; Covariance matrix; Equations; Gaussian noise; Mathematical model; Maximum likelihood estimation; Photometric stereo; depth map; finite difference methods.; maximum likelihood estimation; nonlinear regression;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.249