DocumentCode
1403420
Title
Absolute micro pressure measurements based on a high-overload-resistance sensor
Author
Zhongliang Yu ; Yulong Zhao ; Xiawei Meng ; Bian Tian ; Zhuangde Jiang
Author_Institution
State Key Lab. for Mech. Manuf. Syst. Eng., Xi´an Jiaotong Univ., Xi´an, China
Volume
7
Issue
12
fYear
2012
fDate
12/1/2012 12:00:00 AM
Firstpage
1180
Lastpage
1183
Abstract
Presented is a piezoresistive absolute micro pressure sensor, which is of great benefit for altitude location. In this investigation, the design, fabrication and testing of the sensor are carried out. By analysing the stress distribution on sensitive elements using the finite-element method (FEM), a novel structure through the introduction of beams into the standard bossed diaphragm is built up. The proposed configuration presents its advantages in terms of sensitivity and overload resistance compared with the standard bossed diaphragm and conventional plane diaphragm structures. The sensor is fabricated based on silicon bulk micromachining technology, and the detailed processing program is discussed. Calibration data obtained through measurements are in good agreement with the results of the FEM analysis. Testing results demonstrate that the sensor features a high sensitivity of 11.098 V/V/Pa in the operating range of 500 Pa at room temperature, and a high-overload resistance (200 times overload) to protect it from being destroyed under atmospheric environment. Owing to the excellent performance, the sensor can be applied for measuring absolute micro pressure lower than 500 Pa.
Keywords
calibration; finite element analysis; micromachining; microsensors; piezoresistive devices; pressure measurement; pressure sensors; sensitivity; FEM analysis; MEMS devices; absolute micro pressure measurements; calibration data; conventional plane diaphragm structures; finite-element method; high-overload-resistance sensor; overload resistance; piezoresistive absolute micro pressure sensor; pressure 500 Pa; sensitivity; silicon bulk micromachining technology; standard bossed diaphragm; stress distribution; temperature 293 K to 298 K;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2012.0549
Filename
6419588
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