DocumentCode :
1403492
Title :
Micro fabrication of lead-free (K,Na)NbO3 piezoelectric thin films by dry etching
Author :
Kurokawa, Fujio ; Yokokawa, Ryuji ; Kotera, Hidetoshi ; Horikiri, F. ; Shibata, Kenji ; Mishima, Takeshi ; Sato, Mitsuhisa ; Kanno, Issei
Author_Institution :
Micro Eng., Kyoto Univ., Kyoto, Japan
Volume :
7
Issue :
12
fYear :
2012
fDate :
12/1/2012 12:00:00 AM
Firstpage :
1223
Lastpage :
1225
Abstract :
Micro fabrication has been conducted for sodium potassium niobate [(K,Na)NbO3, KNN] thin films by dry etching and Pt/KNN/Pt unimorph micro cantilevers have been fabricated as a lead-free piezoelectric micro electro mechanical system (MEMS). KNN etching by Ar/C4F8 plasma showed a high etching rate of about 60 nm/min and KNN/Cr selectivity of over 5. Tip displacement of the Pt/KNN/Pt micro cantilevers was measured and the frequency response and piezoelectric properties were evaluated. Young s modulus and piezoelectric coefficients d31 of the KNN thin film were estimated to be 115 GPa and 99 to 219 pm/V, respectively. These results indicate that Ar/C4F8 plasma etching does not degrade the piezoelectric properties of KNN thin films and enables one to fabricate various lead-free piezoelectric MEMS applications.
Keywords :
Young´s modulus; cantilevers; micromechanical devices; piezoelectric thin films; platinum; potassium compounds; sodium compounds; sputter etching; Ar-C4F8 plasma etching; KNN-Cr selectivity; KNbO3NaNbO3; Pt-KNN-Pt microcantilevers; Pt-KNN-Pt unimorph microcantilevers; Pt-KNbO3NaNbO3-Pt; Young´s modulus; dry etching; frequency response; lead-free (K,Na)NbO3 piezoelectric thin films; lead-free piezoelectric microelectro mechanical system; microfabrication; piezoelectric MEMS; piezoelectric coefficients; tip displacement; velocity 1 nm/s;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2012.0570
Filename :
6419599
Link To Document :
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