DocumentCode
1403507
Title
Micro-machined resonant out-of-plane accelerometer with a differential structure fabricated by silicon-on-insulator–MEMS technology
Author
Junbo Wang ; Yanlong Shang ; Jian Chen ; Zhenguo Sun ; Deyong Chen
Author_Institution
State Key Lab. of Transducer Technol., Inst. of Electron., Beijing, China
Volume
7
Issue
12
fYear
2012
fDate
12/1/2012 12:00:00 AM
Firstpage
1230
Lastpage
1233
Abstract
A new micro-machined resonant accelerometer with a differential structure enabling the detection of out-of-plane acceleration is described. The microaccelerometer consists of two sensitive structures composed of seismic masses, flexural hinges and double-clamped resonant beams. Owing to thickness differences and neutral axis variations among these three components, in response to an out-of-plane acceleration, the movements of the seismic masses lead to stress build up in flexural hinges, further translated as axial forces applied on resonant beams. In this differential design, under acceleration, one resonant beam is under a tensile stress, whereas the other one is under a compressive stress, producing a differential resonant frequency output. The microaccelerometer was fabricated by a silicon-direct-bonding silicon-on-insulator wafer with MEMS fabrication and a low-stress packaging method was also developed. Based on a closed-loop control circuit for resonant beam excitation and detection, device characterisation was conducted, producing a quality factor of 436 in air and a differential sensitivity of 813 Hz/g.
Keywords
Q-factor; accelerometers; compressive strength; elemental semiconductors; hinges; micromachining; microsensors; seismology; silicon-on-insulator; stress analysis; tensile strength; MEMS fabrication; axial force translation; clamped resonant beam; closed loop control circuit; compressive stress; differential resonant frequency; differential sensitivity; differential structure; flexural hinge; microaccelerometer; micromachined resonant accelerometer; neutral axis variation; out-of-plane acceleration detection; packaging method; quality factor; resonant beam detection; resonant beam excitation; seismic mass; silicon direct bonding; silicon-on-insulator; tensile stress;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2012.0536
Filename
6419601
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