• DocumentCode
    1403535
  • Title

    Dynamics of carbon nanotubes mass detection involving phonon-tunnelling dissipation

  • Author

    Zuo-Yang Zhong ; Su-Juan Liu ; Wen-Ming Zhang ; Guang Meng ; Chang-Ming Cheng

  • Author_Institution
    State Key Lab. of Mech. Syst. & Vibration, Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    7
  • Issue
    12
  • fYear
    2012
  • fDate
    12/1/2012 12:00:00 AM
  • Firstpage
    1246
  • Lastpage
    1250
  • Abstract
    Nanomechanical (NEMS) resonators made from carbon nanotubes (CNTs) have emerged as ubiquitous devices for use in mass detection. Many oscillation behaviours of CNT mass detection have been theoretically studied by the continuum elastic model, albeit their performance is limited by deleterious effects of mechanical damping. Reported are the support-induced losses in generic mechanical resonators because of the tunnelling of mesoscopic phonons between the CNT and its supports. After formulating the problem, the resulting differential equations are solved analytically using the method of multiple scales, and a closed form solution is obtained. The results reveal that the Young´s modulus, density and geometric parameters of the CNT not only influence the resonant frequency shift and the system stiffness, but also affect the system vibration amplitude. Moreover, the effect of the supports material on the oscillation is discussed. Also, the phonon-tunnelling dissipation for dynamics of CNT mass detection is highlighted.
  • Keywords
    Young´s modulus; carbon nanotubes; damping; differential equations; elastic constants; mass measurement; mesoscopic systems; nanoelectromechanical devices; oscillations; tunnelling; vibrations; C; NEMS; Young´s modulus; carbon nanotubes; closed form solution; continuum elastic model; differential equations; mass detection; mechanical damping; mesoscopic phonons; multiple scale method; nanomechanical resonators; oscillation behaviour; phonon-tunnelling dissipation; resonant frequency shift; support-induced losses; system stiffness; system vibration amplitude;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2012.0670
  • Filename
    6419605