DocumentCode :
1403757
Title :
Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops
Author :
Tao Su ; Unger, Michael ; Steinecke, Thomas ; Weigel, Robert
Author_Institution :
Sch. of Phys. & Eng., Sun Yat-sen Univ., Guangzhou, China
Volume :
54
Issue :
4
fYear :
2012
Firstpage :
772
Lastpage :
784
Abstract :
The response of the microcontrollers to conducted radio frequency interference depends strongly on the frequency of the interference signals. As a symbol of the strong frequency dependence, dips appear on the immunity-frequency curve of the microcontrollers. This paper discovers that some of the immunity dips are due to resonances in the current loops through the input and output pins of the oscillator amplifier. Those dips are called foot-point immunity dips. With theoretical analysis, measurements, simulations, and optimizations, this paper gives a systematic description and treatment on the foot-point immunity dips.
Keywords :
amplifiers; microcontrollers; oscillators; radiofrequency interference; conducted radiofrequency immunity degradation; electromagnetic resonances; foot-point immunity dips; foot-point loops; immunity-frequency curve; interference signals; microcontrollers; oscillator amplifier; radiofrequency interference; Electromagnetic compatibility; electromagnetic interference (EMI); integrated circuits (ICs); microcontrollers; oscillators;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2011.2178098
Filename :
6109339
Link To Document :
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