DocumentCode
1403757
Title
Degradation of the Conducted Radio Frequency Immunity of Microcontrollers Due to Electromagnetic Resonances in Foot-Point Loops
Author
Tao Su ; Unger, Michael ; Steinecke, Thomas ; Weigel, Robert
Author_Institution
Sch. of Phys. & Eng., Sun Yat-sen Univ., Guangzhou, China
Volume
54
Issue
4
fYear
2012
Firstpage
772
Lastpage
784
Abstract
The response of the microcontrollers to conducted radio frequency interference depends strongly on the frequency of the interference signals. As a symbol of the strong frequency dependence, dips appear on the immunity-frequency curve of the microcontrollers. This paper discovers that some of the immunity dips are due to resonances in the current loops through the input and output pins of the oscillator amplifier. Those dips are called foot-point immunity dips. With theoretical analysis, measurements, simulations, and optimizations, this paper gives a systematic description and treatment on the foot-point immunity dips.
Keywords
amplifiers; microcontrollers; oscillators; radiofrequency interference; conducted radiofrequency immunity degradation; electromagnetic resonances; foot-point immunity dips; foot-point loops; immunity-frequency curve; interference signals; microcontrollers; oscillator amplifier; radiofrequency interference; Electromagnetic compatibility; electromagnetic interference (EMI); integrated circuits (ICs); microcontrollers; oscillators;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2011.2178098
Filename
6109339
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