• DocumentCode
    1403769
  • Title

    A robust analog interface system for submicron CMOS video DSP

  • Author

    Redman-White, William ; Duffee, Roy ; Bramwell, Simon ; Rijns, Hans ; James, Shirley ; Tijou, James ; van der Weide, Gerard

  • Author_Institution
    Philips Semicond., Southampton, UK
  • Volume
    33
  • Issue
    7
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    1076
  • Lastpage
    1081
  • Abstract
    This paper describes the front-end architecture for a fully integrated low-voltage CMOS video DSP function, including AGC, equalization, clamping, sync, and A/D conversion. With multiple clock domains and many high-activity pads, the large digital section of the IC generates high levels of substrate and power line noise, which cannot be avoided with quiet period sampling. The analog section is therefore designed to minimize the injected noise by other circuit techniques. The system maximizes the available dynamic range in the 3.3-V supply, with several high-bandwidth rail-to-rail functions. A novel arrangement with high noise immunity level estimators is used to clamp the video in the middle of the dynamic range of the input amplifier, hence reducing amplification of unwanted dc components. Extensive mixed signal test facilities are also included in the design. The chip is fabricated in 0.5-μm CMOS, and operates from a single 3.3-V supply
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; automatic gain control; digital signal processing chips; equalisers; integrated circuit noise; video signal processing; 0.5 micron; 3.3 V; A/D conversion; AGC; clamping; dynamic range; equalization; front-end architecture; high-activity pads; high-bandwidth rail-to-rail functions; injected noise; mixed signal test facilities; multiple clock domains; power line noise; robust analog interface system; submicron CMOS video DSP; substrate noise; Clamps; Clocks; Digital integrated circuits; Digital signal processing; Dynamic range; Integrated circuit noise; Noise generators; Noise level; Power generation; Robustness;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.701264
  • Filename
    701264