Reproducible optical fiber tips for photon scanning tunneling microscopy with very small (<5°) cone angle

Author

Klini, A. ; David, T. ; Bourillot, E. ; Emonin, S. ; Papadopoulos, P. ; Goudonnet, J.P. ; Kotrotsios, G.

Author_Institution

Assoc. for Res. Technol. & Training, Heraklion, Greece

Volume

16

Issue

7

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1220

Lastpage

1227

Abstract

Sharp optical fiber tips for photon scanning tunneling microscopes (PSTMs) have been fabricated by employing a new alternative technique for etching multimode optical fibers. The tip diameter is less than 30 mm, while the cone full-angle can be as sharp as 3°. To the knowledge of the authors, such tips are the sharpest reported up to now. Measurements, with 19 tips, of the evanescent wave decay distance produced by frustrated reflection of light on a same sample, show good reproducibility. Furthermore, the PSTM images, taken with the new tips, are very sharp and fit with images of the same sample obtained with an atomic force microscope (AFM)

Keywords

etching; light reflection; optical fibre fabrication; optical images; optical microscopes; scanning tunnelling microscopy; PSTM images; atomic force microscope; cone full-angle; decay distance; frustrated light reflection; good reproducibility; multimode optical fiber etching; optical fabrication; photon scanning tunneling microscopy; reproducible optical fiber tips; tip diameter; very small cone angle; Atomic force microscopy; Atomic measurements; Chemicals; Etching; Optical fibers; Optical microscopy; Probes; Reproducibility of results; Silicon compounds; Tunneling;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.701400

Filename

701400