DocumentCode :
1404237
Title :
Reproducible optical fiber tips for photon scanning tunneling microscopy with very small (<5°) cone angle
Author :
Klini, A. ; David, T. ; Bourillot, E. ; Emonin, S. ; Papadopoulos, P. ; Goudonnet, J.P. ; Kotrotsios, G.
Author_Institution :
Assoc. for Res. Technol. & Training, Heraklion, Greece
Volume :
16
Issue :
7
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1220
Lastpage :
1227
Abstract :
Sharp optical fiber tips for photon scanning tunneling microscopes (PSTMs) have been fabricated by employing a new alternative technique for etching multimode optical fibers. The tip diameter is less than 30 mm, while the cone full-angle can be as sharp as 3°. To the knowledge of the authors, such tips are the sharpest reported up to now. Measurements, with 19 tips, of the evanescent wave decay distance produced by frustrated reflection of light on a same sample, show good reproducibility. Furthermore, the PSTM images, taken with the new tips, are very sharp and fit with images of the same sample obtained with an atomic force microscope (AFM)
Keywords :
etching; light reflection; optical fibre fabrication; optical images; optical microscopes; scanning tunnelling microscopy; PSTM images; atomic force microscope; cone full-angle; decay distance; frustrated light reflection; good reproducibility; multimode optical fiber etching; optical fabrication; photon scanning tunneling microscopy; reproducible optical fiber tips; tip diameter; very small cone angle; Atomic force microscopy; Atomic measurements; Chemicals; Etching; Optical fibers; Optical microscopy; Probes; Reproducibility of results; Silicon compounds; Tunneling;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.701400
Filename :
701400
Link To Document :
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