Title :
Propagation loss measurements in semiconductor microcavity ring and disk resonators
Author :
Rafizadeh, D. ; Zhang, J.P. ; Tiberio, R.C. ; Ho, S.T.
fDate :
7/1/1998 12:00:00 AM
Abstract :
We report the measurement of cavity propagation losses in nearly single-mode semiconductor waveguide-coupled ring and disk microcavity optical resonators. Using a novel 10.5-μm-diameter ring resonator, we measure transverse electric (TE) and transverse magnetic (TM) field intensity losses in 0.35-μm-wide ring waveguide cavities in the 1.55-μm-wavelength region. We present the experimental results for nanofabricated AlGaAs-GaAs 10.5-μm-diameter ring and disk resonators to quantify cavity losses and to show the feasibility of these promising and robust submicron-scale devices
Keywords :
III-V semiconductors; aluminium compounds; electromagnetic fields; gallium arsenide; integrated optics; nanotechnology; optical communication equipment; optical couplers; optical loss measurement; optical resonators; 0.35 mum; 1.55 mum; 10.5 mum; AlGaAs-GaAs; AlGaAs-GaAs disk resonators; TE field intensity loss measurement; TM field intensity loss measurement; cavity losses; cavity propagation losses; disk resonators; nanofabricated AlGaAs-GaAs ring resonators; nearly single-mode semiconductor waveguide-coupled ring resonators; propagation loss measurements; robust submicron-scale devices; semiconductor microcavity ring resonators; Electric variables measurement; Loss measurement; Magnetic field measurement; Microcavities; Optical losses; Optical resonators; Optical ring resonators; Optical waveguides; Propagation losses; Semiconductor waveguides;
Journal_Title :
Lightwave Technology, Journal of
