• DocumentCode
    1404467
  • Title

    A Ku-band T-shaped gate GaAs power MESFET with high breakdown voltage for satellite communications

  • Author

    Jong-Lam Lee ; Haecheon Kim ; Jae Kyoung Mun ; Sung-Jae Maeng

  • Author_Institution
    Pohang Univ. of Sci. & Technol., South Korea
  • Volume
    19
  • Issue
    7
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    250
  • Lastpage
    252
  • Abstract
    /sup G/aAs power MESFET´s with 0.5-μm T-shaped gate for Ku-band power applications have been developed using a new self-aligned and optical lithography. It displays a maximum current density of 350 mA/mm, an uniform transconductance of 150 mS/mm and a high gate-to-drain breakdown voltage of 35 V. Both the high breakdown voltage and the uniform transconductance were achieved by the new MESFET design incorporating an undoped GaAs cap and a thick lightly doped active layers. The breakdown voltage is the highest one among the values reported on the power devices. The device exhibits 0.61 W/mm power density and 47% power added efficiency with 9.0 dB associated gain at a drain bias of 12 V and an operation frequency of 12 GHz.
  • Keywords
    III-V semiconductors; current density; electric breakdown; gallium arsenide; microwave field effect transistors; microwave power amplifiers; microwave power transistors; photolithography; power MESFET; satellite communication; 0.5 mum; 12 GHz; 12 V; 150 mS/mm; 35 V; 47 percent; 9.0 dB; GaAs; Ku-band T-shaped gate GaAs power MESFET; Ku-band power applications; T-shaped gate; drain bias; gain; high breakdown voltage; high gate-to-drain breakdown voltage; maximum current density; operation frequency; power added efficiency; power amplifiers; power density; satellite communications; self-aligned optical lithography; thick lightly doped active layers; undoped GaAs cap; uniform transconductance; Displays; Electron beams; Frequency; Gallium arsenide; HEMTs; Heterojunctions; Lithography; MESFETs; Satellite communication; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.701433
  • Filename
    701433